An integrated debugging system based on E-beam test
- 31 December 1987
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 7 (2-4) , 275-282
- https://doi.org/10.1016/s0167-9317(87)80022-9
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Verification Testing—A Pseudoexhaustive Test TechniqueIEEE Transactions on Computers, 1984