Sampling jitter in Fourier-transform spectrometers: spectral broadening and noise effects

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Abstract
The effect of sampling jitter induced by frequency fluctuations of the reference laser is analyzed theoretically. It is shown that the spectral broadening of the lines is small enough to permit the use of single-mode laser diodes in medium-to-high-resolution spaceborne instruments. The same mathematical formalism is used to give a new insight into the analysis of the spectral noise induced by random sampling jitter caused by detector and electronic noise.