Advanced IGBT modules for railway traction applications: Reliability testing
- 1 June 1998
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 38 (6-8) , 1319-1323
- https://doi.org/10.1016/s0026-2714(98)00150-4
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Evolution of VLSI Reliability Engineering8th Reliability Physics Symposium, 1990