The evaluation of buried-channel layer in BCCD's

1 May 1978

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 25 (5) , 544-546
https://doi.org/10.1109/T-ED.1978.19126

Abstract

A simple method of evaluating buried-channel layers in BCCD's, using current-voltage measurement, is presented. This method is based on the assumption of uniform layer doping and depletion approximation. The validity of this evaluation method is demonstrated by agreement between calculated and experimental results.

Keywords

BURIED CHANNEL
SIMPLE METHOD
LAYER DOPING
CHANNEL LAYER
CURRENT VOLTAGE
DEPLETION APPROXIMATION
BCCD'S
USING CURRENT
EVALUATING BURIED

This publication has 0 references indexed in Scilit: