Simple method for yield measurements of secondary ions desorbed by fast heavy ions of variable energy
- 1 November 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 189 (2-3) , 615-619
- https://doi.org/10.1016/0029-554x(81)90451-1
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Desorption of organic compounds from solid surfaces by bombardment with heavy ions from a tandem acceleratorSurface Science, 1980
- New approach to the mass spectroscopy of non-volatile compoundsBiochemical and Biophysical Research Communications, 1974
- Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline TargetsPhysical Review B, 1969