X-Ray-Induced Photoconductivity in Dielectric Materials

1 June 1975

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 22 (3) , 1958-1963
https://doi.org/10.1109/TNS.1975.4328037

Abstract

X-ray-induced photoconductivity has been measured in low-density polyethylene, Tefzel ‡ (Dupont fluorocarbon), Durasan (Dupont fluorocarbon), polychlorotrifluoroethylene (Kel-F), polystyrene, polypropylene, polyvinylidene chloride, polyvinylidene fluoride, polyvinyl chloride and mica. Dose rates varied in the range 109 - 5 × 1010 rad/s. The observed photoconductivity showed no apparent dependence on the molecular structure of the materials. The photoconductivity of polyethylene and Kel-F was observed to depend on the degree of crystallinity in these materials.

Keywords

This publication has 1 reference indexed in Scilit:

X-Ray-Induced Photoconductivity in Dielectric Films
IEEE Transactions on Nuclear Science, 1972