The Optoelectronic Properties of a-Si, Ge:H(F) Alloys)

• 1 January 1988
• journal article
• Published by Springer Nature in MRS Proceedings
• Vol. 118
• https://doi.org/10.1557/proc-118-623

Abstract

Keywords

• SURVEY
• MODELS
• OPTOELECTRONIC
• EOPT
• DEFECTS
• EXPERIMENTAL
• URBACH