Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
- 1 January 1993
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 11 (1) , 108-111
- https://doi.org/10.1116/1.586709
Abstract
No abstract availableThis publication has 0 references indexed in Scilit: