Cavity Perturbation Techniques for Measurement of the Microwave Conductivity and Dielectric Constant of a Bulk Semiconductor Material
- 1 February 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 20 (2) , 126-132
- https://doi.org/10.1109/tmtt.1972.1127695
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Techniques for the Measurement of Complex Microwave Conductivity and the Associated ErrorsIEEE Transactions on Microwave Theory and Techniques, 1970
- Electrodeless Determination of Semiconductor Conductivity from TE01°-Mode ReflectivityJournal of Applied Physics, 1967
- "Gap Effect" in Measurement of Large Permittivities (Correspondence)IEEE Transactions on Microwave Theory and Techniques, 1966
- Perturbation theory of resonant cavitiesProceedings of the IEE Part C: Monographs, 1960
- Extension of Onsager's Theory of Reciprocal Relations. IPhysical Review B, 1954