Characterising the UHF factory radio channel

10 September 1987

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 23 (19) , 1015-1017
https://doi.org/10.1049/el:19870712

Abstract

Portable UHF factory multipath measurement apparatus is being used to measure multipath delay profiles and narrowband fading at five large manufacturing sites in the mid-western US. Preliminary data indicate that typical RMS delay spreads range from 100 to 250 ns and that average CW path loss varies as distance to the power 2-2. This work is the first report of extensive multipath measurements in factory environments.

Keywords

LARGE MANUFACTURING SITES
CW PATH LOSS
NARROWBAND FADING
FACTORY ENVIRONMENTS
RMS DELAY SPREADS
EXTENSIVE MULTIPATH MEASUREMENTS
100 TO 250 NS
MULTIPATH MEASUREMENT APPARATUS
UHF FACTORY RADIO CHANNEL

This publication has 0 references indexed in Scilit: