Microwave measurement of thin-film transducer coupling constant

1 June 1967

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 55 (6) , 1099-1101
https://doi.org/10.1109/proc.1967.5745

Abstract

A method for measuring the transducer film coupling constant of microwave thin-film piezoelectric transducers is presented. Measured coupling constant data for a simple form of CdS transducer is reported, and is compared with published data for bulk, single crystals of CdS.

Keywords

MICROWAVE MEASUREMENTS
ACOUSTIC TRANSDUCERS
PIEZOELECTRIC TRANSDUCERS
PIEZOELECTRIC FILMS
RESONANCE
DELAY LINES
MICROWAVE TRANSISTORS
THIN FILM CIRCUITS
ACOUSTIC MEASUREMENTS
FREQUENCY MEASUREMENT

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