The elimination of tuning-induced burnout and bias circuit oscillations in IMPATT oscillators
- 1 January 1973
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A single-tuned oscillator for IMPATT characterizationsProceedings of the IEEE, 1970
- A Proposed High-Frequency, Negative-Resistance DiodeBell System Technical Journal, 1958