High-pressure device for use in low energy x-ray absorption spectroscopy
- 1 April 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 208 (1-3) , 647-650
- https://doi.org/10.1016/0167-5087(83)91198-5
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Extended x-ray absorption fine structure of NaBr and Ge at high pressureJournal of Applied Physics, 1980
- X-Ray Absorption Study of Mixed-Valence TmSePhysical Review Letters, 1980
- X-Ray Absorption at High PressurePhysical Review Letters, 1978
- EXAFS Measurement of High-Pressure Metallic Phase of GaAs by Use of a Diamond Anvil CellJapanese Journal of Applied Physics, 1978
- A method for the accurate measurement of lattice compressions of low-Z materials at pressures up to 12 GPa by x-ray diffractionReview of Scientific Instruments, 1974
- An Optical Fluorescence System for Quantitative Pressure Measurement in the Diamond-Anvil CellReview of Scientific Instruments, 1973