Thermoelectric Power of Thin Gold Films
- 1 August 1971
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 42 (9) , 3634-3639
- https://doi.org/10.1063/1.1660781
Abstract
The thermoelectric power and temperature coefficient of resistance of gold films has been measured and related to the energy dependence of both the mean free path of conduction electrons and the area of the Fermi surface. Values obtained for the quantities (dlnλ/dlnW)W=WF and (dlnA/dlnW)W=WF are − 0.60±0.04 and − 0.85±0.04, respectively. These quantities can be determined without knowing the surface‐scattering coefficient or sample thickness if the films have the same structure as the bulk material.This publication has 15 references indexed in Scilit:
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