Thermoelectric Power of Thin Gold Films

Abstract
The thermoelectric power and temperature coefficient of resistance of gold films has been measured and related to the energy dependence of both the mean free path of conduction electrons and the area of the Fermi surface. Values obtained for the quantities (dlnλ/dlnW)W=WF and (dlnA/dlnW)W=WF are − 0.60±0.04 and − 0.85±0.04, respectively. These quantities can be determined without knowing the surface‐scattering coefficient or sample thickness if the films have the same structure as the bulk material.