Sensor selection techniques in device monitoring
- 10 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Deriving fault location and control from a functional modelPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Characterizing diagnoses and systemsArtificial Intelligence, 1992
- Modeling digital circuits for troubleshootingArtificial Intelligence, 1991
- Diagnosing multiple faultsArtificial Intelligence, 1987
- Engineering Voyager 2's Encounter with UranusScientific American, 1986
- Causality in device behaviorArtificial Intelligence, 1986