X-Ray Diffraction Study of Heteroepitaxy of MOCVD Grown TiO2 and VO2 Films on Sapphire Single Crystals
- 1 January 1991
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Four-circle angle calculations for surface diffractionJournal of Applied Crystallography, 1988
- Substrate-induced strain and orientational ordering in adsorbed monolayersPhysical Review B, 1979