Theoretical and observed electron microscope images of impurity atoms in thin crystals formed by L-shell ionization electrons

This publication has 15 references indexed in Scilit:

• In-situ observation of movement of atoms and identification of thorium atoms by core-loss electron imaging
  Microscopy Microanalysis Microstructures, 1993
• Design and first applications of a post-column imaging filter
  Microscopy Microanalysis Microstructures, 1992
• Observations on quick fluctuation of atom images of Si crystal lattice under 800 kV electron irradiation
  Ultramicroscopy, 1991
• Electron microscope observation of the structure and behaviour of stacking fault tetrahedra and single vacancies in gold crystals irradiated by 2 MeV electrons
  Physica Status Solidi (a), 1985
• Stem microanalysis by transmission electron energy loss spectroscopy in crystals
  Ultramicroscopy, 1982
• Observations of point defects in silicon by means of dark-field lattice plane imaging
  Physica Status Solidi (a), 1982
• The crystallographic information in localised characteristic loss electron images and diffraction patterns
  Ultramicroscopy, 1981
• K, L, and M shell generalized oscillator strengths and ionization cross sections for fast electron collisions
  The Journal of Chemical Physics, 1980
• K-shell ionization cross-sections for use in microanalysis
  Ultramicroscopy, 1979
• On the possibility of the direct imaging of point defects in crystals using transmission electron microscopy
  Philosophical Magazine, 1977