The Measurement of Drift Mobility in Semiconductors
- 1 December 1952
- journal article
- letter
- Published by IOP Publishing in Proceedings of the Physical Society. Section B
- Vol. 65 (12) , 994-995
- https://doi.org/10.1088/0370-1301/65/12/114
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- The Mobility and Life of Injected Holes and Electrons in GermaniumPhysical Review B, 1951
- Hole Injection in Germanium-Quantitative Studies and Filamentary Transistors*Bell System Technical Journal, 1949
- Investigation of Hole Injection in Transistor ActionPhysical Review B, 1949