Exact corrections for potential modulation distortion in Auger yield measurements
- 2 July 1973
- journal article
- Published by Elsevier in Surface Science
- Vol. 38 (2) , 283-291
- https://doi.org/10.1016/0039-6028(73)90162-3
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Quantitative aspects of Auger electron spectroscopySurface Science, 1972
- Instrument Response Functions for Potential Modulation DifferentiationReview of Scientific Instruments, 1972
- A Secondary Emission Analog for Improved Auger Spectroscopy with Retarding Potential AnalyzersReview of Scientific Instruments, 1971