A Note on Testing Logic Circuits by Transition Counting
- 1 March 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-26 (3) , 313-314
- https://doi.org/10.1109/TC.1977.1674831
Abstract
Test sets to detect single and multiple stuck-at faults in combinational networks by transition counting are given.Keywords
This publication has 1 reference indexed in Scilit:
- Transition Count Testing of Combinational Logic CircuitsIEEE Transactions on Computers, 1976