High resolution time-of-flight mass spectrometers. Part III. Reflector design
- 1 October 1990
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 61 (10) , 2592-2600
- https://doi.org/10.1063/1.1141843
Abstract
The reflector has a central influence on the properties of a time-of-flight mass spectrometer. The mass resolution can be greatly improved using a reflector with homogeneous fields. A reflector with homogeneous fields can also have focusing properties and thus enhance sensitivity of the instrument. In this case it is important to be aware of design limitations. We present a mathematical method of determining these limitations and also give a guideline for mechanical design.Keywords
This publication has 5 references indexed in Scilit:
- High-resolution time of-flight mass spectrometers. Part II. Cross beam ion opticsReview of Scientific Instruments, 1990
- High-resolution time-of-flight mass spectrometerReview of Scientific Instruments, 1989
- High-resolution time-of-flight mass spectrometers: Part I. Effects of field distortions in the vicinity of wire meshesReview of Scientific Instruments, 1989
- A time‐of‐flight mass analyzer with high resolving powerRapid Communications in Mass Spectrometry, 1988
- Notizen: A High-Resolution Time-of-Flight Mass Spectrometer Using Laser Resonance IonizationZeitschrift für Naturforschung A, 1985