Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy
- 15 November 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 30 (10) , 6211-6213
- https://doi.org/10.1103/physrevb.30.6211
Abstract
We have analyzed angle-resolved x-ray photoelectron spectroscopy data and found that large intensity enhancements along internuclear axes are due to forward-direction focusing of the electron beam by an attractive potential. Away from the internuclear axes, we found secondary peaks whose intensity is dominated by a structure factor. Results of forward-direction focusing for Cu(001) are presented and a high-energy limit of the internuclear enhancement is derived.Keywords
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