Sample dependence of the electron-phonon electrical resistivity in simple metals at low temperatures

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Abstract
It is shown that the contribution to the resistivity from low-frequency phonons does not vanish in the full drag limit when the electron-defect scattering is anisotropic. This applies to unannealed samples, where the electron-dislocation scattering is important. The theory is consistent with experiments in the temperature range 2-3 K, where electron-phonon scattering dominates over electron-electron scattering and where there is evidence for phonon drag in annealed samples.