Surface Debye temperature of Si(001) surfaces measured by HEED
- 1 October 1977
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 67 (1) , 358-361
- https://doi.org/10.1016/0039-6028(77)90390-9
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Surface Debye temperature of the Si (001)-2 × 2 structureSurface Science, 1974
- Temperature dependence of intensities from silicon with glancing incidence HEEDActa Crystallographica Section A, 1973
- Calculation of Reflected Intensities for Medium and High Energy Electron DiffractionZeitschrift für Naturforschung A, 1972
- Temporary Protection of Silicon Surfaces by Iodine FilmsJournal of the Electrochemical Society, 1966
- Notizen: Der Debye–Waller-Faktor in der dynamischen Theorie von Röntgen- und Elektroneninterferenzen an KristallenZeitschrift für Naturforschung A, 1965
- Theorie der Beugung von Elektronen an KristallenAnnalen der Physik, 1928