Abstract
The authors measured the current I against the voltage V as a parameter of magnetic field H and also H against V as a parameter of I below Tc for Bi2Sr2CaCu2O8+y thin films with the c axis perpendicular to the surface of the substrate. Any appreciable anisotropy on the characteristic nonlinear behaviour of I against V could not be observed between two cases of I parallel and perpendicular to H in the basal plane. Therefore, these nonlinearities should not be ascribed to any origin due to the macroscopic Lorentz force working on flux lines. Some possible origins are presented.