An electron diffraction study of amorphous silicon oxide films
- 1 December 1979
- journal article
- research article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 34 (3) , 323-334
- https://doi.org/10.1016/0022-3093(79)90019-x
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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- Optical properties of non-crystalline Si, SiO, SiOx and SiO2Journal of Physics and Chemistry of Solids, 1971
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- Structure of Silicon MonoxideJournal of the Electrochemical Society, 1969
- A Study of Amorphous SiOThe Journal of Physical Chemistry, 1959
- Optical Properties of Silicon Monoxide in the Wavelength Region from 024 to 140 Microns*Journal of the Optical Society of America, 1954
- Preparation, Structure, and Applications of Thin Films of Silicon Monoxide and Titanium DioxideJournal of the American Ceramic Society, 1950