Observations on a method of determining the carrier lifetime in p+-ν-n+ diodes
- 31 May 1969
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 12 (5) , 385-391
- https://doi.org/10.1016/0038-1101(69)90094-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Recombination in silicon p−π−n diodesSolid-State Electronics, 1967
- On the Transient Behavior of Semiconductor RectifiersJournal of Applied Physics, 1955
- Statistics of the Recombinations of Holes and ElectronsPhysical Review B, 1952