Analysis of the x-ray photoelectron spectrum of Teflon AF 1600
- 1 July 1997
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 15 (4) , 2143-2147
- https://doi.org/10.1116/1.580620
Abstract
The C 1s, F 1s, and O 1s components of the x-ray photoelectron spectroscopy spectrum of Teflon AF 1600 have been obtained, and their constituent peaks were separated and attributed. The effect of an intervening carbon atom on the F 1s spectrum has been shown to decrease the inductive effect of a next-nearest neighbor fragment. An unexpected chemical shift in the O 1s spectrum has been traced to nonbonded steric interactions of close lying rings.Keywords
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