Source-drain breakdown in thin SOI transistors

Publisher Website

13 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/soi.1989.69744

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Avalanche-induced drain-source breakdown in silicon-on-insulator n-MOSFETs
IEEE Transactions on Electron Devices, 1988