Study on perturbation layer of silicon with "mirage effect" technique
- 1 May 1987
- journal article
- Published by IOP Publishing in Chinese Physics Letters
- Vol. 4 (5) , 213-216
- https://doi.org/10.1088/0256-307x/4/5/006
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Thermal effects in photothermal spectroscopy and photothermal imagingJournal of Applied Physics, 1983
- Photothermal measurements using a localized excitation sourceJournal of Applied Physics, 1981
- Photothermal deflection spectroscopy and detectionApplied Optics, 1981
- Thermo-optical spectroscopy: Detection by the ’’mirage effect’’Applied Physics Letters, 1980