Charge trapping in MOS systems
- 1 November 1972
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 13 (1) , 1-4
- https://doi.org/10.1016/0040-6090(72)90144-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Stabilization of MOS devicesSolid-State Electronics, 1967
- DENSITY OF SiO2–Si INTERFACE STATESApplied Physics Letters, 1966