Allocation of Test Effort for Minimum Variance of Reliability
- 1 June 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-26 (2) , 111-115
- https://doi.org/10.1109/tr.1977.5220068
Abstract
This paper is concerned with the problem of determining the optimal allocation of test effort among individual components of a system. Using knowledge of the relationship between component uncertainty and system uncertainty, and component and system test costs, the test allocation is determined so as to minimize the variance of an estimator of overall system reliability. The optimal allocations for a series system and a parallel system are examined as special cases. The sensitivity of the optimal allocation is examined with respect to differences in system configuraition.Keywords
This publication has 3 references indexed in Scilit:
- Approximately Optimum Confidence Bounds on Series- and Parallel-system Reliability for Systems with Binomial Subsystem DataIEEE Transactions on Reliability, 1974
- Confidence Intervals for Some Functions of Several Bernoulli Parameters with Reliability ApplicationsJournal of the American Statistical Association, 1973
- Confidence Limits for System Reliability: A Sequential MethodIEEE Transactions on Reliability, 1971