Dating of obsidian artifacts by depth-profiling of artificially hydrated surface layers
- 31 December 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 191 (1-3) , 403-407
- https://doi.org/10.1016/0029-554x(81)91036-3
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Hydration of soda-lime glassPublished by Elsevier ,2003
- Sodium-hydrogen interdiffusion in sodium silicate glassesJournal of Non-Crystalline Solids, 1980
- Glass leaching studies by sputter-induced photon spectrometry (SIPS)Journal of Non-Crystalline Solids, 1980
- Hydration of obsidianNature, 1978
- Obsidian Hydration Profiles Measured by Sputter-Induced Optical EmissionScience, 1978
- Obsidian hydration profile measurements using a nuclear reaction techniqueNature, 1974
- Part I, The Development of the MethodAmerican Antiquity, 1960