Chapter 7.1 X-ray photoelectron spectroscopy of TiO2/V2O5 catalysts
- 30 May 1994
- journal article
- Published by Elsevier in Catalysis Today
- Vol. 20 (1) , 109-123
- https://doi.org/10.1016/0920-5861(94)85020-8
Abstract
No abstract availableKeywords
This publication has 25 references indexed in Scilit:
- Data compilations: their use to improve measurement certainty in surface analysis by aes and xpsSurface and Interface Analysis, 1986
- Measurement: AES and XPSJournal of Vacuum Science & Technology A, 1985
- Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instrumentsSurface and Interface Analysis, 1984
- Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 1—The establishment of reference procedures and instrument behaviourSurface and Interface Analysis, 1984
- XPS: Energy calibration of electron spectrometers. 2—Results of an interlaboratory comparisonSurface and Interface Analysis, 1984
- An experimental and theoretical study of the transmission function of a commercial hemispherical electron energy analyserSurface and Interface Analysis, 1982
- Is there a universal mean-free-path curve for electron inelastic scattering in solids?Journal of Electron Spectroscopy and Related Phenomena, 1981
- Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysisSurface and Interface Analysis, 1981
- Quantitative chemical analysis by ESCAJournal of Electron Spectroscopy and Related Phenomena, 1976
- Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eVJournal of Electron Spectroscopy and Related Phenomena, 1976