Self-Testing Embedded Parity Checkers
- 1 August 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-33 (8) , 753-756
- https://doi.org/10.1109/tc.1984.5009365
Abstract
It is shown that if a 4-by-n binary matrix has four distinct even-parity rows such that each column has exactly two 0's and two 1's, then there exists a totally self-checking even-parity checker that is tested by the four rows of this matrix. The utility of this result in designing self-testing embedded parity checkers is described.Keywords
This publication has 2 references indexed in Scilit:
- Self-Testing Embedded Parity CheckersIEEE Transactions on Computers, 1984
- Optimum test patterns for parity networksPublished by Association for Computing Machinery (ACM) ,1970