Thermal stability of thin-film amorphous W-Ru, W-Re, and Ta-Ir alloys
- 1 February 1987
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 61 (3) , 1212-1215
- https://doi.org/10.1063/1.338171
Abstract
The crystallization behavior of self-supporting thin-film amorphous W-Ru, W-Re, and Ta-Ir alloys has been studied with transmission electron microscopy. Crystallization temperatures have been observed which are much lower than the temperatures predicted by a semiempirical model: the highest observed temperatures are 775 °C for W-Ru and W-Re alloys, and 900 °C for the Ta-Ir alloys. All three systems show maximum thermal stability at a composition expected using enthalpy considerations.This publication has 6 references indexed in Scilit:
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