Trigger reliability of xenon flashlamps
- 1 October 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 23 (10) , 1166-1169
- https://doi.org/10.1109/T-ED.1976.18563
Abstract
The probability that a trigger pulse will successfully allow a driver circuit to discharge its energy through a xenon flashlamp is discussed. Based on a classical description of trigger spark formation and propagation statistics, the misflash probability, Pm, is described in terms of the ionization rate in the flash-lamp, β; the trigger pulsewidth, te; and the normalized trigger pulse overvoltage (Vs- Vst)/Vdc. This model was experimentally validated for series and parallel trigger circuits over a broad range of trigger pulse voltages, Vs, and pulseforming network voltages, VB.Keywords
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