Buerger precession camera and overall characterization of thin films and flat-plate crystals

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Abstract
A fast simple and non-destructive method is described to provide qualitative structural information for flat-plate crystals and epitaxically grown films. The technique, based upon the Buerger precession camera, produces an easy-to-interpret photograph of the reciprocal space of all the components at once: substrate, film or buffer layer, and/or superlattice. A wide variety of technologically important examples are used to illustrate the technique: a mixture of CdTe phases on (001) Si, an aluminium layer on a (001) Si substrate, (001) Ge epitaxic layers on (001) Si substrates, three combinations of possible orientations of CdTe epitaxic layers on various substrate types, CdTe/ZnTe and other II–VI superlattices on GaAs substrates. In addition, the precession pictures readily reveal the common [111] face-centered cubic twin fault, or stacking disorder, seen in bulk growth methods. This finding may have severe consequences for the electronic mobility and the feasibility of devices fabricated from these composite systems.

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