Quantitative SIMS measurements of Al(x)Ga(1−x)As as a function of alloy composition and ion beam energy
- 1 November 1986
- Vol. 36 (11-12) , 861-863
- https://doi.org/10.1016/0042-207x(86)90127-2
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Quantitative analysis of low alloy steels by secondary ion mass spectrometryAnalytical Chemistry, 1976
- The behaviour of surfaces under ion bombardmentReports on Progress in Physics, 1975