Notizen:MMM Profiles of HeI Lines: Ion Dynamics Effect

Open Access

1 June 1979

journal article
Published by Walter de Gruyter GmbH in Zeitschrift für Naturforschung A

Vol. 34 (6) , 773-775
https://doi.org/10.1515/zna-1979-0616

Abstract

Stark profiles of the HeI 4471 and 4922 Å overlapping lines are calculated by the Model Microfield Method. Even at high densities (3·10¹⁶ cm^-3) an ion dynamics effect is exhibited by varying the reduced mass of the radiator -perturber system or the ionic temperature.

Keywords

MMM
HEI
MODEL
PERTURBER
MICROFIELD
OVERLAPPING
STARK
IONIC
NOTIZEN

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