Interpretation of Field-Ion-Microscopy Data for Surface Diffusion and Clustering
- 15 April 1973
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 7 (8) , 4016-4018
- https://doi.org/10.1103/physrevb.7.4016
Abstract
Kinetic considerations for surface diffusion and clustering are discussed in relation to recent field-ion-microscopy results by Tsong. It is emphasized that the data lead to a single rate-determining activation energy and cannot be used to distinguish between various possible stable adatom sites and migration mechanisms. The data for clustering indicate that the binding energy for clustering is small relative to migration energies. It is suggested that standard analysis is not consistent with the observations and that some mechanism such as a temperature-dependent activation energy for migration may be operating.Keywords
This publication has 3 references indexed in Scilit:
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- The effect of an electric field on the surface diffusion of rhenium adsorbed on tungstenJournal of Physics D: Applied Physics, 1969
- Atomic View of Surface Self-Diffusion: Tungsten on TungstenThe Journal of Chemical Physics, 1966