Identification and measurement of phases in MnBi thin films using an X-ray diffractometric technique
- 16 May 1971
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 5 (2) , K91-K94
- https://doi.org/10.1002/pssa.2210050231
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Magneto-Optic Properties of Quenched Thin Films of MnBi and Optical Memory ExperimentsJournal of Applied Physics, 1970
- The Magnetic and Crystallographic Properties of MnBi Studied by Neutron Diffraction.Acta Chemica Scandinavica, 1967
- Neutron Diffraction Study of the Structures and Magnetic Properties of Manganese BismuthidePhysical Review B, 1956
- Magnetic Transformation in MnBiPhysical Review B, 1955
- Les points de transformation des composés définis MnAs, MnBi en relation avec un mécanisme probable d'antiferromagnétismeJournal de Physique et le Radium, 1951
- Polymorphisme du composé défini Mn Bi aux températures de disparition et de réapparition de l'aimantation spontanéeJournal de Physique et le Radium, 1951