Efficient management of critically important systems
- 1 January 1978
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 17 (1) , 173-178
- https://doi.org/10.1016/0026-2714(78)91151-4
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A Note on the Physical Meaning of the Weibull DistributionIEEE Transactions on Reliability, 1975