Potentiometry and repair of electrically stressed nanowires using atomic force microscopy
- 23 February 1998
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 72 (8) , 915-917
- https://doi.org/10.1063/1.120872
Abstract
Using an atomic force microscope equipped with a conducting diamond tip, the surface potential on a current carrying gold nanowire was measured with microvolt potential sensitivity and nanometer spatial resolution. Potentiometry images illustrate the stages of failure of nanowires subjected to current stressing. During this failure process, a discontinuity in the potential gradient and an enhanced resistance region were observed at the failure site until a complete fracture was formed. By increasing the repulsive force and accurately positioning the tip, gold could be manipulated into the nanoscale fracture so that the electrical conductivity of the nanowire was regained.Keywords
This publication has 11 references indexed in Scilit:
- Scanning probe microscopy for testing ultrafast electronic devicesOptical and Quantum Electronics, 1996
- Vacuum compatible high-sensitive Kelvin probe force microscopyReview of Scientific Instruments, 1996
- Development of highly conductive cantilevers for atomic force microscopy point contact measurementsJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1995
- Characterization of tips for conducting atomic force microscopyReview of Scientific Instruments, 1995
- Electromigration and related failure mechanisms in integrated circuit interconnectsInternational Materials Reviews, 1994
- Kelvin probe force microscopyApplied Physics Letters, 1991
- Nanolithography at 350 KV in a TEMMicroelectronic Engineering, 1989
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988
- Fabrication of 30-nm-scale structures for electron transport studies using a polymethylmethacrylate bilayer resistJournal of Vacuum Science & Technology B, 1987
- Scanning tunneling potentiometryApplied Physics Letters, 1986