Transistor abnormalities as revealed by current-voltage characteristics
- 1 January 1969
- journal article
- Published by Institution of Engineering and Technology (IET) in Radio and Electronic Engineer
- Vol. 38 (5) , 251-268
- https://doi.org/10.1049/ree.1969.0107
Abstract
The examination of a suspect transistor to determine its mode of degradation or failure always includes, at an early stage, checks on its junction and transistor characteristics, usually with the aid of a visual display on a curve tracer. This paper discusses the diagnostic significance of some of the abnormalities which may be observed on such displays.Keywords
This publication has 1 reference indexed in Scilit:
- Semiconductor Junctions and DevicesJournal of the Electrochemical Society, 1966