The conduction channels on MIS and MIM structure splits
- 1 December 1978
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 55 (2) , 169-178
- https://doi.org/10.1016/0040-6090(78)90046-9
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Characteristics and potential applications of GaAs1-xPx MIS structuresSolid-State Electronics, 1974
- Investigations of mis structure inhomogeneities using a scanning mercury probePhysica Status Solidi (a), 1973
- Physical model for the current noise spectrum of MOSTSJournal of Physics D: Applied Physics, 1969