Feasibility of quantitative analysis of metals and alloys by non‐resonant multiphoton ionization of sputtered neutral species
- 1 August 1995
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 23 (9) , 623-635
- https://doi.org/10.1002/sia.740230908
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Quantitative depth profile and bulk analysis with high dynamic range by electron gas sputtered neutral mass spectrometryJournal of Vacuum Science & Technology A, 1988
- Nonresonant multiphoton ionization of the neutrals ablated in laser microprobe mass spectrometry analysis of GaAs and Hg0.78Cd0.22TeJournal of Applied Physics, 1987
- Post-Ionization of Sputtered Particles: A Brief ReviewPublished by Springer Nature ,1986
- General Postionization of Sputtered and Desorbed Species by Intense Untuned RadiationPublished by Springer Nature ,1986
- Solids analysis using energetic ion bombardment and multiphoton resonance ionization with time-of-flight detectionAnalytical Chemistry, 1984
- Surface analysis by nonresonant multiphoton ionization of desorbed or sputtered speciesAnalytical Chemistry, 1984
- Quantitative Secondary Neutral Mass Spectrometry Analysis of Alloys and Oxide-Metal-InterfacesPublished by Springer Nature ,1983
- Topics on Multiphoton Processes in AtomsPublished by Elsevier ,1976
- Developments in secondary ion mass spectroscopy and applications to surface studiesSurface Science, 1975
- Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline TargetsPhysical Review B, 1969