X-Ray Topographic Observation of Copper Whisker Crystals

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Abstract
Copper whisker crystals, carefully grown from cuprous iodide by vapour reduction, were studied by means of x-ray topography and optical microscopy. About 50 whisker crystals with growth orientations [001], [110] and [111] were examined in a thickness range from 10 to 80 µ. None of them contained an axial dislocation. The same was true for kinked and spiral whisker crystals. The whisker crystals are in a high degree of perfection even at the thickness of 80 µ, although some of them contained lattice defects introduced accidentally during the growth. Results obtained indicate that copper whisker crystals do not grow by the growth mechanism, in which an axial screw dislocation plays an important role. There is a contrast change at the tip of the whisker crystal. Impurities at the tip may take part in the growth.