High‐order and multipole aberrations by aberration integral and direct ray‐tracing methods
- 2 August 1995
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 179 (2) , 161-169
- https://doi.org/10.1111/j.1365-2818.1995.tb03628.x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A computer program for electron gun design using second-order finite elementsJournal of Vacuum Science & Technology B, 1989
- A computational and experimental analysis of fifth-order deflection aberrationsJournal of Vacuum Science and Technology, 1981
- SURFACE PATCHES AND B-SPLINE CURVESPublished by Elsevier ,1974