Phase measurement X-ray interferometry

• 1 October 1989
• journal article
• Published by Elsevier in Journal of X-Ray Science and Technology
• Vol. 1  (2) , 134-142
• https://doi.org/10.1016/0895-3996(89)90036-0

Abstract

Keywords

• INTERFEROMETRY
• FRINGE ANALYSIS
• DATA ANALYSIS
• UNCERTAINTIES
• INTERFEROMETER
• INTERPOLATION
• SILICON
• DISPLACEMENT MEASUREMENTS
• STANDARD